Publications

Selected publications
Book chapters
Complete list of papers
Complete list of reports
Ph. D. thesis




Selected publications

most recent first

Vacuum ultraviolet smoothing of nanometer-scale asperities of poly(methyl methacrylate) surface
Automatic drift elimination in probe microscope images based on techniques of counter-scanning and topography feature recognition
Feature-oriented scanning methodology for probe microscopy and nanotechnology
Object-oriented scanning for probe microscopy and nanotechnology
Digital data readback for a probe storage device
Automatic lateral calibration of tunneling microscope scanners
Analytical model for the approximation of hysteresis loop and its application to the scanning tunneling microscope
Fast-acting piezoactuator and digital feedback loop for scanning tunneling microscopes

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Journal of Surface. Roentgen, Synchrotron and Neutron Studies, number 1, pages 5-16, January 2010
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques, volume 4, number 1, pages 1-11, January-February 2010

Vacuum ultraviolet smoothing of nanometer-scale asperities of poly(methyl methacrylate) surface

R. V. Lapshin1, 2, A. P. Alekhin1, 2, A. G. Kirilenko1, S. L. Odintsov1, V. A. Krotkov1

1State Scientific Center of Russian Federation, Institute of Physical Problems named after F. V. Lukin, Zelenograd, Moscow, Russia
2Moscow Institute of Physics and Technology, Dolgoprudny, Moscow Region, Russia


Smoothing of nanometer-scale asperities of poly(methyl methacrylate) (PMMA) film by using vacuum ultraviolet (VUV) with wavelength λ=123.6 nm is investigated. During the VUV-treatment, an exposure time and a residual air pressure in the working chamber are varied. A nanostructured surface of PMMA film is used as a sample to be exposed. The nanostructured surface is obtained by treating the initial spin-coated smooth PMMA film in oxygen radio-frequency plasma. The conclusion regarding to degree of VUV-exposure is based on the changes fixed in topography morphology and roughness of the nanostructured surface. Surface topography of the PMMA film is measured by the atomic-force microscopy (AFM). Recognition of morphological surface features and determination of their main geometrical characteristics on the AFM-images are performed by using the method of virtual feature-oriented scanning. The detailed investigation of morphology and Fourier spectra shows that the nanostructured surface of PMMA film is partially-ordered. The VUV-smoothing method developed can be used for treatment of electron-beam, UV or X-ray sensitive PMMA-resists, PMMA-elements of microelectromechanical systems, biomedical PMMA-implants, and for validation of nanotechnological equipment having UV sources.


Copyright © 2010 MAIK “Nauka/Interperiodica”. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the MAIK “Nauka/Interperiodica”

Full text (in Russian)

Original source: MAIK “Nauka/Interperiodica”

Copyright © 2010 Pleiades Publishing Ltd. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the Pleiades Publishing Ltd.

Full text

Original source: Springer Science+Business Media LLC
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Measurement Science and Technology, volume 18, issue 3, pages 907-927, March 2007

Automatic drift elimination in probe microscope images based on techniques of counter-scanning and topography feature recognition

Rostislav V. Lapshin

Solid Nanotechnology Laboratory, Institute of Physical Problems, Zelenograd, Moscow, 124460, Russian Federation

An experimentally proved method for the automatic correction of drift-distorted surface topography obtained with a scanning probe microscope (SPM) is suggested. Drift-produced distortions are described by linear transformations valid for the case of rather slow changing of the microscope drift velocity. One or two pairs of counter-scanned images (CSIs) of surface topography are used as initial data. To correct distortions, it is required to recognize the same surface feature within each CSI and to determine the feature lateral coordinates. Solving a system of linear equations, the linear transformation coefficients suitable for CSI correction in the lateral and the vertical planes are found. After matching the corrected CSIs, topography averaging is carried out in the overlap area. Recommendations are given that help both estimate the drift correction error and obtain the corrected images where the error does not exceed some preliminarily specified value. Two nonlinear correction approaches based on the linear one are suggested that provide a greater precision of drift elimination. Depending on the scale and the measurement conditions as well as the correction approach applied, the maximal error may be decreased from 8-25% to 0.6-3%, typical mean error within the area of corrected image is 0.07-1.5%. The method developed permits us to recover drift-distorted topography segments/apertures obtained by using feature-oriented scanning. The suggested method may be applied to any instrument of the SPM family.


Copyright © 2007 Institute of Physics Publishing Ltd. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the Institute of Physics Publishing

Full text

Original source: Measurement Science and Technology, IOP
Article Usage & Citations

Copyright © 2007 R. V. Lapshin. The Russian translation of the article may be downloaded for personal use only. Any other use requires prior permission of the author

Russian translation

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Nanotechnology, volume 15, issue 9, pages 1135-1151, September 2004

Feature-oriented scanning methodology for probe microscopy and nanotechnology

Rostislav V. Lapshin

Solid Nanotechnology Laboratory, Institute of Physical Problems, Zelenograd, Moscow, 124460, Russia

A real-time scanning algorithm is suggested which uses features of the surface as reference points at relative movements. Generally defined hill- or pit-like topography elements are taken as the features. The operation of the algorithm is based upon local recognition of the features and their connection to each other. The permissible class of surfaces includes ordered, partially ordered, or disordered surfaces if their features have comparable extents in the scan plane. The method allows one to exclude the negative influence of thermodrift, creep, and hysteresis over the performance of a scanning probe microscope. Owing to the possibility of carrying out an unlimited number of averages, the precision of measurements can be considerably increased. The distinctive feature of the method is its ability of topography reconstruction when the ultimate details are smaller than those detectable by a conventional microscope scan. The suggested approach eliminates the restrictions on scan size. Nonlinearity, nonorthogonality, cross coupling of manipulators as well as the Abbé offset error are corrected with the use of scan-space-distributed calibration coefficients which are determined automatically in the course of measuring a standard surface by the given method. The ways of precise probe positioning by local surface features within the fine manipulator field and the coarse manipulator field, automatic probe return into the operational zone after sample dismounting, automatic determination of exact relative position of the probes in multiprobe instruments, as well as automatic successive application of the whole set of probes to the same object on the surface are proposed. The possibility of performing accurately localized low-noise spectroscopy is demonstrated. The developed methodology is applicable for any scanning probe devices.


Copyright © 2004 Institute of Physics Publishing Ltd. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the Institute of Physics Publishing

Full text

Original source: Nanotechnology, IOP
Article Usage & Citations

Copyright © 2004 R. V. Lapshin. The Russian translation of the article may be downloaded for personal use only. Any other use requires prior permission of the author

Russian translation

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Ph. D. Thesis, Moscow, December 2002

Object-oriented scanning for probe microscopy and nanotechnology

Rostislav V. Lapshin

Institute of Physical Problems, Zelenograd, Moscow, 124460, Russia

Object- or feature-oriented scanning (OOS) methodology is suggested, developed, and proved experimentally. While measuring or crossing topography, surface features are used as reference points. All probe movements are performed relatively from one feature to another placed nearby. Generally defined hill- or pit-like surface elements are used as features. Surface topography is measured by small parts called segments. Each segment is a square neighborhood of the surface feature. The segments are obtained during the conventional raster-like scanning. The resulting topography image is reconstructed by using the feature segments and the relative distances between the features. All types of surfaces (i. e., ordered, quasiordered, and disordered) may be scanned in feature-oriented manner if only their features have comparable extents in the lateral plane. The proposed OOS permits to eliminate the negative effect of thermodrift, creep, and hysteresis. As a result, an unlimited number of averagings may be carried out theoretically. Due to a large number of the averagings, precision of the scanning probe microscope can be considerably increased. It is possible also to improve resolution of the instrument under the stipulation that a tip of the probe is sharp enough. The suggested approach eliminates the restrictions on scan size. Nonlinearity, nonorthogonality, cross coupling of manipulators as well as the Abbé offset error are corrected with the use of scan-space-distributed calibration coefficients which are determined automatically in the course of measuring a standard surface by the given method. Proposed are the ways of precise probe positioning by local surface features within the fine manipulator field and the coarse manipulator field, automatic probe return into the operational zone after sample dismounting, automatic determination of exact relative position of the probes in multiprobe instruments, as well as automatic successive application of the whole set of probes to the same object on the surface. The possibility of performing accurately localized low-noise spectroscopy is demonstrated. The suggested methodology is applicable for any scanning probe instruments such as scanning tunneling microscope, atomic-force microscope, magnetic force microscope, electrostatic force microscope, near-field scanning optical microscope, and many others, including the scanning electron microscope.


Copyright © 2002 R. V. Lapshin. Ph. D. abstract and thesis may be downloaded for personal use only. Any other use requires prior permission of the author

Abstract (in Russian)

Full text (in Russian)

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Review of Scientific Instruments, volume 71, number 12, pages 4607-4610, December 2000

Digital data readback for a probe storage device

Rostislav V. Lapshin

Institute of Physical Problems, Moscow, Zelenograd 103460, Russia

An experimentally proved method is described for data readback from an information track using separate atoms on a crystal surface as memory elements. The key idea consists of local scanning and recognition of memory elements on the carrier surface followed by attaching the device probe to them so as to keep the probe position over the track.


Copyright © 2000 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics

Full text

Original source: Review of Scientific Instruments, AIP
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Review of Scientific Instruments, volume 69, number 9, pages 3268-3276, September 1998

Automatic lateral calibration of tunneling microscope scanners

Rostislav V. Lapshin

Zelenograd Physical Problems Institute, Zelenograd, Moscow, 103460, Russia

A practical method is described to find automatically the calibration coefficients and residual nonorthogonality of a tunneling microscope scanner. As initial data, the coordinates of three atoms were used forming a triangle in a highly oriented pyrolytic graphite surface appearing in the form of a spatially geometrical measure. A recognition procedure is described which can be applied to determine the lateral coordinates of the atoms. Length and orientation distortions were calculated, estimates of calibration errors were given and the requirement on the nonorthogonality limit was formulated for manipulator a given that ensures measurements of the predetermined accuracy. The sensitivity of the method to a noise in atom coordinates was determined. Experimental data showing the practical suitability of the method developed are presented.


Copyright © 1998 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics

Full text

Original source: Review of Scientific Instruments, AIP
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Review of Scientific Instruments, volume 66, number 9, pages 4718-4730, September 1995

Analytical model for the approximation of hysteresis loop and its application to the scanning tunneling microscope

Rostislav V. Lapshin

“Delta”, Microelectronics and Nanotechnology Research Institute, 2 Schelkovskoye Shosse, Moscow 105122, Russia

A new model description and type classification carried out on its base of a wide variety of practical hysteresis loops are suggested. An analysis of the loop approximating function was carried out; the parameters and characteristics of the model were defined – coersitivity, remanent polarization, value of hysteresis, spontaneous polarization, induced piezocoefficients, value of saturation, hysteresis losses of energy per cycle. It was shown that with piezomanipulators of certain hysteresis loop types, there is no difference in heat production. The harmonic linearization coefficients were calculated, and the harmonically linearized transfer function of a nonlinear hysteresis element was deduced. The hysteresis loop type was defined that possesses minimum phase shift. The average relative approximation error of the model has been evaluated as 1.5%-6% for real hysteresis loops. A procedure for definition of the model parameters by experimental data is introduced. Examples of using the results in a scan unit of a scanning tunneling microscope for compensation of raster distortion are given.


Copyright © 1995 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics

Full text

Original source: Review of Scientific Instruments, AIP
Article Usage & Citations

Copyright © 1995 R. V. Lapshin. The Russian translation of the article may be downloaded for personal use only. Any other use requires prior permission of the author

Russian translation

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Review of Scientific Instruments, volume 64, number 10, pages 2883-2887, October 1993

Fast-acting piezoactuator and digital feedback loop for scanning tunneling microscopes

Rostislav V. Lapshin, Oleg V. Obyedkov

“Microelectronica”, R&D and Production Corporation, Schelkovskoye Shosse 2, 105122, Moscow, Russia

The design of a sectional piezoactuator is described, and the principle of operation of a tunnel junction digital stabilization system is given. The total settling time of the system while the least significant section is in operation is 1 µs at 0.01-nm resolution (in the Z direction). The application of the sectional piezoactuator permitted an increase in operating frequency and also eliminated errors caused by the piezoceramics hysteresis. Introduction of a fast-acting ALU as a digital accumulator of regulation errors made it possible to achieve high stability of the loop operation at high operating frequencies. The system suggested can adapt the speed of the loop operation depending on the relief steepness values. The blunting of the tip and sample destruction is avoided because there is a mechanism of smooth approach of the tip to the nominal scanning height.


Copyright 1993 © American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics

Full text

Original source: Review of Scientific Instruments, AIP
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Book chapters

  1. R. V. Lapshin, Feature-oriented scanning probe microscopy, Encyclopedia of Nanoscience and Nanotechnology, edited by H. S. Nalwa, vol. 14, pp. 105-115, American Scientific Publishers, 2011 (original source: American Scientific Publishers)
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Complete list of papers

most recent first

  1. R. V. Lapshin, Drift-insensitive distributed calibration of probe microscope scanner in nanometer range. Part I. Approach description, Part II. Virtual mode, Part III. Real mode, 2015 (prepared)


  2. R. V. Lapshin, STM observation of a box-shaped graphene nanostructure appeared after mechanical cleavage of pyrolytic graphite, 2015 (prepared)


  3. R. V. Lapshin, R. Z. Khafizov, E. A. Fetisov, Computer processing of the output optical image of a focal plane array of uncooled bimaterial IR-detectors by method of feature-oriented scanning, Instruments and Experimental Techniques, 2014 (in Russian, submitted)


  4. R. Lapshin, Feature-oriented scanning probe microscopy: precision measurements, nanometrology, bottom-up nanotechnologies, Electronics: Science, Technology, Business, Special issue “50 years of the Institute of Physical Problems”, pp. 94-106, 2014 (in Russian, original source: Technosphera Publishers)


  5. R. Lapshin, P. Azanov, Nickel nanoparticles reduce temperature of synthesis of carbon nanostructures, Electronics: Science, Technology, Business, Special issue “50 years of the Institute of Physical Problems”, pp. 112-115, 2014 (in Russian, original source: Technosphera Publishers)


  6. D. B. Rygalin, E. A. Fetisov, R. Z. Khafizov, V. I. Zolotarev, I. A. Reshetnikov, G. A. Rudakov, R. V. Lapshin, E. P. Kirilenko, Promising integral matrix detectors of thermal radiation with optical reading, Russian Microelectronics, vol. 43, no. 7, pp. 516-518, 2014 (original source: Springer Science+Business Media LLC)


  7. R. Z. Khafizov, E. A. Fetisov, R. V. Lapshin, E. P. Kirilenko, V. N. Anastasyevskaya, I. V. Kolpakov, Thermomechanical sensitivity of uncooled bimaterial detector of IR-range fabricated by technology of microoptomechanical systems, Advances in Applied Physics, vol. 1, no. 4, pp. 520-523, 2013 (in Russian, original source: Orion Research & Production Association)


  8. D. B. Rygalin, E. A. Fetisov, R. Z. Khafizov, V. I. Zolotarev, I. A. Reshetnikov, G. A. Rudakov, R. V. Lapshin, E. P. Kirilenko, Advanced infrared focal plane arrays with optical readout, Proceedings of Institutions of Higher Education. Electronics, no. 3, pp. 60-63, 2013 (in Russian)


  9. A. P. Alekhin, G. M. Boleiko, S. A. Gudkova, A. M. Markeev, A. A. Sigarev, V. F. Toknova, A. G. Kirilenko, R. V. Lapshin, E. N. Kozlov, D. V. Tetyukhin, Synthesis of biocompatible surfaces by nanotechnology methods, Russian nanotechnologies, vol. 5, nos. 9-10, pp. 128-136, 2010 (in Russian, original source: Park-Media Co.). A. P. Alekhin, G. M. Boleiko, S. A. Gudkova, A. M. Markeev, A. A. Sigarev, V. F. Toknova, A. G. Kirilenko, R. V. Lapshin, E. N. Kozlov, D. V. Tetyukhin, Synthesis of biocompatible surfaces by nanotechnology methods, Nanotechnologies in Russia, vol. 5, nos. 9-10, pp. 696-708, 2010 (original source: Springer Science+Business Media LLC)


  10. R. V. Lapshin, A. P. Alekhin, A. G. Kirilenko, S. L. Odintsov, V. A. Krotkov, Vacuum ultraviolet smoothing of nanometer-scale asperities of poly(methyl methacrylate) surface, Journal of Surface. Roentgen, Synchrotron and Neutron Studies, no. 1, pp. 5-16, 2010 (in Russian, original source: MAIK “Nauka/Interperiodica”). R. V. Lapshin, A. P. Alekhin, A. G. Kirilenko, S. L. Odintsov, V. A. Krotkov, Vacuum ultraviolet smoothing of nanometer-scale asperities of poly(methyl methacrylate) surface, Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques, vol. 4, no. 1, pp. 1-11, 2010 (original source: Springer Science+Business Media LLC)


  11. R. V. Lapshin, Availability of feature-oriented scanning probe microscopy for remote-controlled measurements on board a space laboratory or planet exploration rover, Astrobiology, vol. 9, no. 5, pp. 437-442, 2009 (original source: Mary Ann Liebert, Inc.)


  12. R. V. Lapshin, Method for automatic correction of drift-distorted SPM-images, Journal of Surface. Roentgen, Synchrotron and Neutron Studies, no. 11, pp. 13-20, 2007 (in Russian, original source: MAIK “Nauka/Interperiodica”). R. V. Lapshin, A method for automatic correction of drift-distorted SPM images, Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques, vol. 1, no. 6, pp. 630-636, 2007 (original source: Springer Science+Business Media LLC)


  13. R. V. Lapshin, Automatic drift elimination in probe microscope images based on techniques of counter-scanning and topography feature recognition, Measurement Science and Technology, vol. 18, iss. 3, pp. 907-927, 2007 (original source: Institute of Physics Publishing, Russian translation is available)


  14. A. P. Alekhin, A. G. Kirilenko, A. I. Kozlitin, R. V. Lapshin, S. N. Mazurenko, Hydrophobic-hydrophilic nanostructure synthesis on polymer surfaces in low-temperature carbon plasma, Journal of Surface. Roentgen, Synchrotron and Neutron Studies, no. 11, pp. 8-11, 2006 (in Russian)


  15. R. V. Lapshin, Automatic distributed calibration of probe microscope scanner, Journal of Surface. Roentgen, Synchrotron and Neutron Studies, no. 11, pp. 69-73, 2006 (in Russian)


  16. R. V. Lapshin, Feature-oriented scanning methodology for probe microscopy and nanotechnology, Nanotechnology, vol. 15, iss. 9, pp. 1135-1151, 2004 (original source: Institute of Physics Publishing, Russian translation is available)


  17. A. P. Alekhin, A. G. Kirilenko, R. V. Lapshin, Surface morphology of thin carbon films deposited from plasma on polyethylene with low density, Journal of Surface. Roentgen, Synchrotron and Neutron Studies, no. 2, pp. 3-9, 2004 (in Russian)


  18. A. P. Alekhin, A. G. Kirilenko, R. V. Lapshin, R. I. Romanov, A. A. Sigarev, Investigation of nanostructured carbon coating on polyethylene as a substrate, Journal of Applied Chemistry, vol. 76, no. 9, pp. 1536-1540, 2003 (in Russian). A. P. Alekhin, A. G. Kirilenko, R. V. Lapshin, R. I. Romanov, A. A. Sigarev, Nanostructured carbon coatings on polyethylene films, Russian Journal of Applied Chemistry, vol. 76, no. 9, pp. 1497-1501, 2003 (original source: Springer Science+Business Media LLC)


  19. S. A. Gavrilov, V. M. Roschin, A. V. Zheleznyakova, S. V. Lemeshko, B. N. Medvedev, R. V. Lapshin, E. A. Poltoratsky, G. S. Rychkov, N. N. Dzbanovsky, N. N. Suetin, AFM investigation of highly ordered nanorelief formation by anodic treatment of aluminum surface, Physics, Chemistry and Application of Nanostructures: Reviews and Short Notes to Nanomeeting 2003, edited by V. E. Borisenko, S. V. Gaponenko, V. S. Gurin, pp. 500-502, World Scientific Publishing, London, UK, 2003 (original source)


  20. R. V. Lapshin, Digital data readback for a probe storage device, Review of Scientific Instruments, vol. 71, no. 12, pp. 4607-4610, 2000 (original source: American Institute of Physics)


  21. R. V. Lapshin, Automatic lateral calibration of tunneling microscope scanners, Review of Scientific Instruments, vol. 69, no. 9, pp. 3268-3276, 1998 (original source: American Institute of Physics)


  22. R. V. Lapshin, V. N. Ryabokony, A. V. Denisov, Measurement of spatial characteristics of ordered surface nanostructures with scanning tunneling microscope, Proceedings of the Second International Scientific and Technical Conference “Microelectronics and Informatics”, part 2, pp. 349-357, Zelenograd, Moscow, Russian Federation, 1997 (in Russian)


  23. R. V. Lapshin, Analytical model for the approximation of hysteresis loop and its application to the scanning tunneling microscope, Review of Scientific Instruments, vol. 66, no. 9, pp. 4718-4730, 1995 (original source: American Institute of Physics, Russian translation is available)


  24. R. V. Lapshin, Hysteresis compensation model for STM scanning unit, Proceedings of the Second International Conference on Nanometer-Scale Science and Technology (NANO-II), Herald of Russian Academy of Technological Sciences, vol. 1, no. 7, part B, pp. 511-529, Moscow, Russia, 1994


  25. R. V. Lapshin, O. V. Obyedkov, Fast-acting piezoactuator and digital feedback loop for scanning tunneling microscopes, Review of Scientific Instruments, vol. 64, no. 10, pp. 2883-2887, 1993 (original source: American Institute of Physics)
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Complete list of reports

most recent first

  1. R. V. Lapshin, Periodic changes in lateral sizes of unit cells at STM images of pyrolytic graphite, Proceedings of the XIX Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation of Solids (SEM-2015), Chernogolovka, Russian Federation, June 1-5, 2015 (in Russian)


  2. R. V. Lapshin, Observation of a hexagonal superstructure on pyrolytic graphite by method of feature-oriented scanning tunneling microscopy, Proceedings of the 25th Russian Conference on Electron Microscopy (SEM-2014), vol. 1, pp. 316-317, Chernogolovka, Russian Federation, June 2-6, 2014 (in Russian). R. V. Lapshin, Observation of a hexagonal superstructure on pyrolytic graphite by method of feature-oriented scanning tunneling microscopy, Presentation at the 25th Russian Conference on Electron Microscopy (SEM-2014), 13 pp., Chernogolovka, Russian Federation, June 4, 2014 (in Russian, English translation is available)


  3. R. V. Lapshin, R. Z. Khafizov, E. A. Fetisov, Computer processing of the output optical image of a focal plane array of uncooled bimaterial IR-detectors by method of feature-oriented scanning, Proceedings of the XXIII International Scientific and Engineering Conference on Photoelectronics and Night Vision Devices, pp. 285-289, RD&P Center “Orion”, Moscow, Russian Federation, May 28-30, 2014 (in Russian, original source, English translation is available). R. V. Lapshin, R. Z. Khafizov, E. A. Fetisov, Computer processing of the output optical image of a focal plane array of uncooled bimaterial IR-detectors by method of feature-oriented scanning, Presentation at the XXIII International Scientific and Engineering Conference on Photoelectronics and Night Vision Devices, 10 pages, RD&P Center “Orion”, Moscow, Russian Federation, May 29, 2014


  4. R. V. Lapshin, Hexagonal superlattice on pyrolytic graphite – a promising length standard for nanometer range, Proceedings of the 1st All-Russian Scientific and Technical Conference “Metrology in Nanotechnologies”, pp. 33-36, Moscow, Russian Federation, April 22-24, 2014 (in Russian). R. V. Lapshin, Hexagonal superlattice on pyrolytic graphite – a promising length standard for nanometer range, Presentation at the 1st All-Russian Scientific and Technical Conference “Metrology in Nanotechnologies”, 14 pp., Moscow, Russian Federation, April 22, 2014 (in Russian, English translation is available)


  5. R. V. Lapshin, STM observation of a box-shaped graphene nanostructure appeared after mechanical cleavage of pyrolytic graphite, Proceedings of the XVIII Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation of Solids (SEM-2013), pp. 386-387, Chernogolovka, Russian Federation, June 3-7, 2013 (in Russian). R. V. Lapshin, STM observation of a box-shaped graphene nanostructure appeared after mechanical cleavage of pyrolytic graphite, Presentation at the XVIII Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation of Solids (SEM-2013), 12 pp., Chernogolovka, Russian Federation, June 5, 2013 (in Russian, English translation is available)


  6. V. A. Bespalov, D. B. Rygalin, E. A. Fetisov, R. Z. Khafizov, V. I. Zolotarev, I. A. Reshetnikov, G. A. Rudakov, R. V. Lapshin, E. P. Kirilenko, Advanced designs and technological approaches for integral matrix sensors of thermal radiation with optical signal modulation comprising microoptomechanical system (MOMS), Proceedings of the 3rd International Scientific and Technical Conference “Technologies of Micro and Nanoelectronics in Micro and Nanosystem Devices”, 3 pp., MIET, Zelenograd, Moscow, Russian Federation, November 28-29, 2012 (in Russian). V. A. Bespalov, D. B. Rygalin, E. A. Fetisov, R. Z. Khafizov, V. I. Zolotarev, I. A. Reshetnikov, G. A. Rudakov, R. V. Lapshin, E. P. Kirilenko, Advanced designs and technological approaches for integral matrix sensors of thermal radiation with optical signal modulation comprising microoptomechanical system (MOMS), Presentation at the 3rd International Scientific and Technical Conference “Technologies of Micro and Nanoelectronics in Micro and Nanosystem Devices”, 20 pp., MIET, Zelenograd, Moscow, Russian Federation, November 28, 2012 (in Russian)


  7. R. Z. Khafizov, E. A. Fetisov, R. V. Lapshin, E. P. Kirilenko, V. N. Anastasyevskaya, I. V. Kolpakov, Thermomechanical sensitivity of bimaterial IR-sensors based on microoptomechanical systems, Proceedings of the XXII International Scientific and Engineering Conference on Photoelectronics and Night Vision Devices, pp. 102-104, RD&P Center “Orion”, Moscow, Russian Federation, May 22-25, 2012 (in Russian, original source, English translation is available). R. Z. Khafizov, E. A. Fetisov, R. V. Lapshin, E. P. Kirilenko, V. N. Anastasyevskaya, I. V. Kolpakov, Thermomechanical sensitivity of bimaterial IR-sensors based on microoptomechanical systems, Presentation at the XXII International Scientific and Engineering Conference on Photoelectronics and Night Vision Devices, 11 pages, RD&P Center “Orion”, Moscow, Russian Federation, May 23, 2012


  8. R. V. Lapshin, Distributed calibration of probe microscope scanner in nanometer range, Proceedings of the XVII Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation of Solids (SEM-2011), p. 94, Chernogolovka, Russian Federation, May 30 - June 2, 2011 (in Russian). R. V. Lapshin, Distributed calibration of probe microscope scanner in nanometer range, Presentation at the XVII Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation of Solids (SEM-2011), 10 pp., Chernogolovka, Russian Federation, June 1, 2011 (in Russian, English translation is available)


  9. R. V. Lapshin, P. V. Azanov, E. P. Kirilenko, Preparation of catalytic nickel nanoparticles of controlled sizes in glow-discharge plasma by repetition of magnetization-deposition cycles, Proceedings of the XV International Symposium “Nanophysics and Nanoelectronics”, vol. 2, pp. 566-567, Nizhni Novgorod, Russian Federation, March 14-18, 2011 (in Russian, original source). R. V. Lapshin, P. V. Azanov, E. P. Kirilenko, Preparation of catalytic nickel nanoparticles of controlled sizes in glow-discharge plasma by repetition of magnetization-deposition cycles, Presentation at the XV International Symposium “Nanophysics and Nanoelectronics”, 12 pp., Nizhni Novgorod, Russian Federation, March 14-18, 2011 (in Russian)


  10. R. V. Lapshin, P. V. Azanov, E. A. Ilyichev, G. N. Petruhin, L. L. Kupchenko, Formation of catalytic Ni-nanoparticles in glow-discharge Ar-plasma for low-temperature synthesis of carbon nanostructures, Proceedings of the XIV International Symposium “Nanophysics and Nanoelectronics”, vol. 2, pp. 563-564, Nizhni Novgorod, Russian Federation, March 15-19, 2010 (in Russian, original source). R. V. Lapshin, P. V. Azanov, E. A. Ilyichev, G. N. Petruhin, L. L. Kupchenko, Formation of catalytic Ni-nanoparticles in glow-discharge Ar-plasma for low-temperature synthesis of carbon nanostructures, Presentation at the XIV International Symposium “Nanophysics and Nanoelectronics”, 11 pp., Nizhni Novgorod, Russian Federation, March 15-19, 2010 (in Russian)


  11. R. V. Lapshin, A. P. Alekhin, A. G. Kirilenko, S. L. Odintsov, V. A. Krotkov, Smoothing of nanoasperities of poly(methyl methacrylate) film by vacuum ultraviolet, Proceedings of the XIII International Symposium “Nanophysics and Nanoelectronics”, vol. 1, pp. 280-281, Nizhni Novgorod, Russian Federation, March 16-20, 2009 (in Russian, original source)


  12. R. V. Lapshin, Automatic distributed calibration of probe microscope scanner, Materials of the Symposium “Nanophysics and Nanoelectronics”, vol. 1, pp. 161-162, Nizhni Novgorod, Russian Federation, March 25-29, 2005 (in Russian, original source)


  13. R. V. Lapshin, Method for automatic correction of drift-distorted SPM-images, Materials of the Symposium “Nanophysics and Nanoelectronics”, vol. 1, pp. 159-160, Nizhni Novgorod, Russian Federation, March 25-29, 2005 (in Russian, original source)


  14. S. A. Gavrilov, V. M. Roschin, A. V. Zheleznyakova, S. V. Lemeshko, B. N. Medvedev, R. V. Lapshin, E. A. Poltoratsky, G. S. Rychkov, N. N. Dzbanovsky, N. N. Suetin, AFM investigation of highly ordered nanorelief formation by anodic treatment of aluminum surface, International Conference “Nanomeeting-2003”, Minsk, Belarus, May 20-23, 2003


  15. R. V. Lapshin, Feature-oriented scanning for spacecraft-borne remote SPM-investigations, Workshop on Micro-Nano Technology for Aerospace Applications, Montreal, Canada, August 25-30, 2002


  16. A. P. Alekhin, A. G. Kirilenko, R. V. Lapshin, A. A. Sigarev, AFM studies of the morphology of the carbon layers deposited on medical low-density polyethylene films by the method of pulsed plasma-arc sputtering of graphite, SPIE International Conference on Nanotechnology and MEMS, Galway, Ireland, September 5-6, 2002


  17. S. A. Gavrilov, A. V. Emelyanov, E. A. Ilyichev, R. V. Lapshin, V. M. Roschin, Fabrication technique and characteristic investigation of field-controlled nanotransistors, All-Russian Scientific and Technical Conference “Micro- and Nano-electronics 2001”, vol. 2, p. P1-1, Zvenigorod, Moscow, Russian Federation, October 1-5, 2001 (in Russian)


  18. R. V. Lapshin, Digital data readback method for a probe storage device, The Third International Scientific and Technical Conference “Electronics and Informatics – XXI Century”, pp. 169-170, Zelenograd, Moscow, Russian Federation, November 22-24, 2000 (in Russian)


  19. R. V. Lapshin, Probe positioning of scanning microscope-nanolithograph by local surface features, The Third International Scientific and Technical Conference “Electronics and Informatics – XXI Century”, pp. 167-168, Zelenograd, Moscow, Russian Federation, November 22-24, 2000 (in Russian)


  20. R. V. Lapshin, Correction of drift-distorted SPM-images, The Third International Scientific and Technical Conference “Electronics and Informatics – XXI Century”, pp. 76-77, Zelenograd, Moscow, Russian Federation, November 22-24, 2000 (in Russian)


  21. R. V. Lapshin, Procedure for atom recognition in STM-images, The Third International Scientific and Technical Conference “Microelectronics and Informatics”, pp. 222-223, Zelenograd, Moscow, Russian Federation, November 11-12, 1997 (in Russian)


  22. S. A. Gavrilov, A. V. Emelyanov, R. V. Lapshin, V. N. Ryabokony, O. I. Chegnova, Electrochemical nanometer-scale structuring of silicon surface, The Third International Scientific and Technical Conference “Microelectronics and Informatics”, pp. 155-156, Zelenograd, Moscow, Russian Federation, November 11-12, 1997 (in Russian)


  23. R. V. Lapshin, V. N. Ryabokon, A. V. Denisov, Scanning tunneling microscope measurements of the spatial characteristics of ordered surface nanostructures, The Fourth International Conference on Nanometer-Scale Science and Technology (NANO-IV), Beijing, P. R. China, September 8-12, 1996


  24. A. V. Denisov, R. V. Lapshin, V. N. Ryabokony, Measurement technique of ordered self-assembly nanometer-sized structures with tunneling microscopy, The Second International Scientific and Technical Conference “Microelectronics and Informatics”, pp. 159-160, Zelenograd, Moscow, Russian Federation, November 23-24, 1995 (in Russian)


  25. R. V. Lapshin, Hysteresis compensation model for STM scanning unit, The Second International Conference on Nanometer-Scale Science and Technology (NANO-II), Moscow, Russia, August 2-6, 1993
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Ph. D. thesis

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